Use of Optical Sorting to Detect Karnal Bunt-Infected Wheat Kernels

نویسندگان

  • Floyd E. Dowell
  • Theodore N. Boratynski
  • Alan K. Dowdy
چکیده

A high-speed sorter was used to remove kernels infected with Karnal bunt from 1800g wheat samples. When the sorter removed about 8% or more of the sample, the reject portion contained 100% of the bunted kernels. Concentrating the bunted kernels in a smaller sample size will reduce sample inspection time and should reduce inspection errors. One high-speed sorter can process up to 8800 kg/hr, thus bunted kernels can be rapidly removed from samples or large lots. The instrument sorted each sample in less than 1 minute. This technology provides the wheat industry with a tool to rapidly inspect samples to aid in regulating Karnal bunt, and to remove bunted grains from seed wheat and wheat destined for food or feed use.

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تاریخ انتشار 2002